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Having had problems with loss of data in retentive memory I have now studied and I think undertstood the issues of EEPROM permanent memory an shorter retentive memory backed up by supercapacitor or battery. If I change my code so that the critical data is now I believe backed up in EEPROM - how can I test its function without waiting for weeks for the supercapacitor to expire ? I can of course use SM0.2 to show it's happening . G

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